A Novel Algorithm for Greatly Accurate Electrical Fault Detection and Classification Based on Haar Wavelet

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Abstract

The present investigation presents an algorithm for fault detection and classification in transmission lines using the Haar-type wavelet mother transform. Voltage and current signals contain all the information of the power system, therefore when a fault occurs in the electrical power system, these signals present disturbances in their amplitude, phase changes and presence of harmonics. Mathematically, all mother wavelets respond with an impulse when there is an abrupt change in the signals, this property allows to detect when a fault has occurred (in the time domain). Experimental results have shown that with frequencies above 100 kHz it is possible to detect a fault with 100% accuracy by taking only 4 samples of the signal and applying the Haar wavelet. The fault detection times vary between 0.31 ms and 1.15 ms and the fault classification times vary between 0.94 s and 1.31 s.

Original languageEnglish
Title of host publicationSmart Technologies, Systems and Applications - 2nd International Conference, SmartTech-IC 2021, Revised Selected Papers
EditorsFabián R. Narváez, Julio Proaño, Paulina Morillo, Diego Vallejo, Daniel González Montoya, Gloria M. Díaz
PublisherSpringer Science and Business Media Deutschland GmbH
Pages143-157
Number of pages15
ISBN (Print)9783030991692
DOIs
StatePublished - 2022
Event2nd International Conference on Smart Technologies, Systems and Applications, SmartTech-IC 2021 - Quito, Ecuador
Duration: 1 Dec 20213 Dec 2021

Publication series

NameCommunications in Computer and Information Science
Volume1532 CCIS
ISSN (Print)1865-0929
ISSN (Electronic)1865-0937

Conference

Conference2nd International Conference on Smart Technologies, Systems and Applications, SmartTech-IC 2021
Country/TerritoryEcuador
CityQuito
Period1/12/213/12/21

Bibliographical note

Publisher Copyright:
© 2022, Springer Nature Switzerland AG.

Keywords

  • Fault detection (FD)
  • Fault diagnosis
  • Fault location (FL)
  • Fault-type classification (FC)
  • Wavelet transforms

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