Resumen
Impaired glucose tolerance (IGT), impaired fasting glucose (IFG) and insulin resistance (IR) are prediabetic conditions diagnosed by glucose and insulin values measured by oral glucose tolerance test (OGTT). In the OGTT, insulin and glucose levels are measured in five different blood samples: a sample in fasting (minute 0) and four others after oral intake of 75 gr. of glucose, at intervals of 30 minutes (minute 30, 60, 90 and 120). The values of glucose at 0 and 120 minutes from OGTT are used for the diagnosis of IFG and IGT, respectively. Several parameters had been used to diagnose the IGT and IFG, such as abdominal circumference, HOMA-IR, area under the curve of glucose during OGTT, among others. However, none of these studies have explored obtaining cut-off points from the area under the curve of insulin (AUCI) during OGTT for IGT and IFG diagnosis. For this propose a database of 172 subjects with values of glucose and insulin during OGTT was used. To assess the predictive capacity of AUCI the receiver operating characteristic (ROC) curves were performed and it was calculated the area under the ROC curve (AUCROC), negative predictive value (NPV) and positive predictive value (PPV). The results show that AUCI can predict the IFG (AUCROC=0.71) and IGT (AUCROC=0.65). The AUCI can discriminate between the subjects that undergo IFG and IGT in concomitance from the subjects that only undergo one of the pathologies. All these findings suggested that AUCI could be used as a diagnostic method for IFG and IGT.
Idioma original | Inglés |
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Título de la publicación alojada | 2019 IEEE 4th Ecuador Technical Chapters Meeting, ETCM 2019 |
Editorial | Institute of Electrical and Electronics Engineers Inc. |
ISBN (versión digital) | 9781728137643 |
DOI | |
Estado | Publicada - nov. 2019 |
Evento | 4th IEEE Ecuador Technical Chapters Meeting, ETCM 2019 - Guayaquil, Ecuador Duración: 13 nov. 2019 → 15 nov. 2019 |
Serie de la publicación
Nombre | 2019 IEEE 4th Ecuador Technical Chapters Meeting, ETCM 2019 |
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Conferencia
Conferencia | 4th IEEE Ecuador Technical Chapters Meeting, ETCM 2019 |
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País/Territorio | Ecuador |
Ciudad | Guayaquil |
Período | 13/11/19 → 15/11/19 |
Nota bibliográfica
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