Road-mapping to determine dangerous curves

Edgar A. Mendez-Ordonez, Alexander V. Medina, Esteban F. Ordonez-Morales, Martin Lopez-Nores, Jack F. Bravo-Torres

Producción científica: Capítulo del libro/informe/acta de congresoContribución de conferenciarevisión exhaustiva

1 Cita (Scopus)

Resumen

In this document we present the design of a Road-Mapping to Determine Dangerous Curves or R-MDDC algorithm. Our R-MDCC approach works with physical road design metrics such as directive speed, superelevation, side friction factor and radius, which are obtained from tables and tachymeter maps. R-MDCC compares the values obtained automatically from the tachymetric map (.dwg or.dxf files), with the values recommended by agencies working on road regulation and design. Three conditions are evaluated radius, superelevation and velocity to categorize a curve according to three levels of danger defined as desirable curve, low-risk curve and high-risk curve. The algorithm returns two files, one in pdf format that contains a table that owns the actual and desired values of each mapped curve of the road and the other file is a map in.kml format, where the analyzed curves are depicted with their respective categorization. The results shown by our R-MDCC proposal encourage us to think that it can be a help tool for government agencies and engineers in charge of road management and construction. This with the aim of verifying if the roads designed and built comply with the required design and safety guidelines and, if applicable, make the necessary corrections and signaling to protect the lives of drivers and passengers.

Idioma originalInglés
Título de la publicación alojada2020 IEEE ANDESCON, ANDESCON 2020
EditorialInstitute of Electrical and Electronics Engineers Inc.
ISBN (versión digital)9781728193656
DOI
EstadoPublicada - 13 oct. 2020
Evento2020 IEEE ANDESCON, ANDESCON 2020 - Quito, Ecuador
Duración: 13 oct. 202016 oct. 2020

Serie de la publicación

Nombre2020 IEEE ANDESCON, ANDESCON 2020

Conferencia

Conferencia2020 IEEE ANDESCON, ANDESCON 2020
País/TerritorioEcuador
CiudadQuito
Período13/10/2016/10/20

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© 2020 IEEE.

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