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Neural network for processing ultrasonic signals in flaw detection control systems

  • Anna Grevtseva
  • , Khuan Dominges
  • , Mateo Dominges

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The basic methods of non-destructive testing of metallic media and their compounds are considered. The expediency of using ultrasonic testing to identify various types of defects is substantiated. It is shown that, unlike other methods, its application does not lead to the destructive consequences of a material or compounds of metallic materials. It is noted that the principle of operation of ultrasonic devices is based on the analysis of the shape and amplitude of the emitted and reflected waves from the boundary of two media. Based on the established differences in forms and amplitudes, it is possible to identify the presence of defects and determine its type. Decryption of defects is carried out by the person who decides on the danger of the defect. To make a reliable decision, he needs information about the value of the speed of propagation of ultrasound in a specific material. The speed of ultrasound in different materials differs significantly in value. It is also necessary to perform an analysis of the forms of ultrasonic waves. Neural networks make it possible to find solutions to complex problems that require analytical calculations similar to those performed by the human brain. It was found that the use of a neural network for signal processing and calibration of ultrasonic sensors reduces the calibration time. The results of the developed neural network are presented.

Original languageEnglish
Title of host publicationProceedings of the 2020 IEEE International Conference on Electrical Engineering and Photonics, EExPolytech 2020
EditorsElena Velichko
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages180-183
Number of pages4
ISBN (Electronic)9781728188782
DOIs
StatePublished - 15 Oct 2020
Externally publishedYes
Event2020 IEEE International Conference on Electrical Engineering and Photonics, EExPolytech 2020 - Saint Petersburg, Russian Federation
Duration: 15 Oct 202016 Oct 2020

Publication series

NameProceedings of the 2020 IEEE International Conference on Electrical Engineering and Photonics, EExPolytech 2020

Conference

Conference2020 IEEE International Conference on Electrical Engineering and Photonics, EExPolytech 2020
Country/TerritoryRussian Federation
CitySaint Petersburg
Period15/10/2016/10/20

Bibliographical note

Publisher Copyright:
© 2020 IEEE.

Keywords

  • Automatic calibration
  • Conversion algorithm.
  • Defect
  • Metal medium
  • Neural network
  • Reflected ultrasound signal
  • Sensor

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