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Incrementally Generative Adversarial Diagnostics Using Few-Shot Enabled One-Class Learning

  • Ziqiang Pu
  • , Lijuan Yan
  • , Yun Bai
  • , Diego Cabrera
  • , Chuan Li

Research output: Contribution to journalArticlepeer-review

Abstract

In real-world industrial scenarios, fault diagnosis often relies on a significant volume of normal data to detect faults with a few coming samples. The limited sample nature of newly introduced faults can pose challenges for deep learning-based fault diagnosis models. To address this issue, a novel framework named incrementally generative adversarial diagnostics was developed by using few-shot enabled one-class learning (FSEOCL) for effective anomaly detection and fault classification of the new-coming few samples. In the addressed method, a bi-directional generative adversarial network is first trained using only normal data to acquire an encoder for latent representation from time-series data. A few samples of each fault condition in latent space can be then identified and classified correctly through FSEOCL. The effectiveness of the proposed framework is demonstrated through fault diagnosis experiments conducted on both a benchmark bearing and an industrial robot. The results underscore the adaptability of this framework to industrial fault diagnosis scenarios, highlighting its ability to achieve accurate anomaly detection and fault classification compared to state-of-the-art peer methods.

Original languageEnglish
Pages (from-to)12189-12199
Number of pages11
JournalIEEE Transactions on Industrial Informatics
Volume20
Issue number10
DOIs
StatePublished - 2024

Bibliographical note

Publisher Copyright:
© 2005-2012 IEEE.

Keywords

  • Bidirectional generative adversarial network
  • fault diagnosis
  • few-shot learning
  • incremental learning
  • one-class learning

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